
KAF-1001-AAA-CP-AE
Manufacturer: | ON Semiconductor |
Type: | Area Sensors |
Sensor type: | Full Frame CCD |
Pixel size x [µm]: | 24 |
Pixel size y [µm]: | 24 |
Chromatics: | monochrome |
Resolution [MP]: | 1.05 |
Further specification: | No Microlens | CERDIP Package (sidebrazed) |
Horizontal Resolution: | 1024 |
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Jörg Albrecht
Sensors Team | +49 89 710667-0 | sensors@framos.com
Sensors Team | +49 89 710667-0 | sensors@framos.com
The KAF-1001 Image Sensor is a high-performance charge-coupled device (CCD) designed for a wide...plus
Informations sur le produit "KAF-1001-AAA-CP-AE"
The KAF-1001 Image Sensor is a high-performance charge-coupled device (CCD) designed for a wide range of Image sensing applications.
The sensor incorporates true two-phase CCD technology, simplifying the support circuits required to drive the sensor as well as reducing dark current without compromising charge capacity. The sensor also utilizes the TRUESENSE Transparent Gate Electrode to improve sensitivity compared to the use of a standard front side illuminated polysilicon electrode.
Selectable on-chip output amplifiers allow operation to be optimized for different imaging needs: Low Noise (when using the high-sensitivity output) or Maximum Dynamic Range (when using the low-sensitivity output).
Liens supplémentaires vers "KAF-1001-AAA-CP-AE"
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Détails du produit "KAF-1001-AAA-CP-AE"
Manufacturer: | ON Semiconductor |
Type: | Area Sensors |
Sensor type: | Full Frame CCD |
Pixel size x [µm]: | 24 |
Pixel size y [µm]: | 24 |
Chromatics: | monochrome |
Resolution [MP]: | 1.05 |
Further specification: | No Microlens | CERDIP Package (sidebrazed) |
Horizontal Resolution: | 1024 |
Vertical Resolution: | 1024 |
Package: | DIP (Ceramic) |
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