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ON Semi KAF-09000-ABA-DD-BA

Manufacturer: ON Semiconductor
Type: Area Sensors
Sensor type: CCD
Shutter type: Global shutter
Pins / Balls: 34
Pixel size x [µm]: 12
Aspect Ratio: 1 : 1
Pixel size y [µm]: 12
Chromatics: monochrome
Packaging Container:
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Combining high resolution with outstanding sensitivity, the KAF-09000 image sensor has been... altro
Informazione prodotto "KAF-09000-ABA-DD-BA"
Combining high resolution with outstanding sensitivity, the KAF-09000 image sensor has been specifically designed to meet the needs of next-generation low cost digital radiography and scientific imaging systems. The high sensitivity available from 12-micron square pixels combine with a low noise architecture to allow system designers to improve overall image quality, or to relax system tolerances to achieve lower cost. The excellent uniformity of the KAF-09000 image sensor improves overall image integrity by simplifying image corrections, while integrated anti-blooming protection prevents image bleed from over-exposure in bright areas of the image. To simplify device integration, the KAF-09000 image sensor uses the same pin-out and package as the KAF-16801 image sensor. The sensor utilizes a Transparent Gate Electrode to improve sensitivity compared to the use of a standard front side illuminated polysilicon electrode.
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Dettagli prodotto "KAF-09000-ABA-DD-BA"
Manufacturer: ON Semiconductor
Type: Area Sensors
Sensor type: CCD
Shutter type: Global shutter
Pins / Balls: 34
Pixel size x [µm]: 12
Aspect Ratio: 1 : 1
Pixel size y [µm]: 12
Chromatics: monochrome
Resolution [MP]: 9.52
Sensor size [inch/mm]: 645 1.3x
Frame rate [fps]: 0.4
Further specification: Broad Dynamic Range
Horizontal Resolution: 3085
Vertical Resolution: 3085
Package: DIP (Ceramic)
Packaging Container: Sealed Clear Cover Glass with AR coating (both sides)
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