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KAF-09000-ABA-DP-BA

ON Semi KAF-09000-ABA-DP-BA

Chromatics: monochrome
Pixel size x [µm]: 12
Further specification: Broad Dynamic Range | CERDIP Package (sidebrazed pins, CuW)
Packaging Container: Taped Clear Cover Glass (no coatings)
Sensor size [inch/mm]: 645 1.3x
Vertical Resolution: 3085
Resolution [MP]: 9.52
Pixel size y [µm]: 12
Pins / Balls: 34
Packaging Container:
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Combining high resolution with outstanding sensitivity, the KAF-09000 image sensor has been... more
Product information "KAF-09000-ABA-DP-BA"
Combining high resolution with outstanding sensitivity, the KAF-09000 image sensor has been specifically designed to meet the needs of next-generation low cost digital radiography and scientific imaging systems. The high sensitivity available from 12-micron square pixels combine with a low noise architecture to allow system designers to improve overall image quality, or to relax system tolerances to achieve lower cost. The excellent uniformity of the KAF-09000 image sensor improves overall image integrity by simplifying image corrections, while integrated anti-blooming protection prevents image bleed from over-exposure in bright areas of the image. To simplify device integration, the KAF-09000 image sensor uses the same pin-out and package as the KAF-16801 image sensor. The sensor utilizes a Transparent Gate Electrode to improve sensitivity compared to the use of a standard front side illuminated polysilicon electrode.
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Product Details "KAF-09000-ABA-DP-BA"
Chromatics: monochrome
Pixel size x [µm]: 12
Further specification: Broad Dynamic Range | CERDIP Package (sidebrazed pins, CuW)
Packaging Container: Taped Clear Cover Glass (no coatings)
Sensor size [inch/mm]: 645 1.3x
Vertical Resolution: 3085
Resolution [MP]: 9.52
Pixel size y [µm]: 12
Pins / Balls: 34
Manufacturer: ON Semiconductor
Horizontal Resolution: 3085
Frame rate [fps]: 0.4
Sensor type: CCD
Package: DIP (Ceramic)
Shutter type: Global shutter
Type: Area Sensors
Aspect Ratio: 1 : 1
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