
ON Semi KAF-09000-ABA-DP-BA
Manufacturer: | ON Semiconductor |
Type: | Area Sensors |
Sensor type: | CCD |
Shutter type: | Global shutter |
Pins / Balls: | 34 |
Pixel size x [µm]: | 12 |
Aspect Ratio: | 1 : 1 |
Pixel size y [µm]: | 12 |
Protective Film: | yes |
Packaging Container:
Combining high resolution with outstanding sensitivity, the KAF-09000 image sensor has been... more
Product information "KAF-09000-ABA-DP-BA"
Combining high resolution with outstanding sensitivity, the KAF-09000 image sensor has been specifically designed to meet the needs of next-generation low cost digital radiography and scientific imaging systems. The high sensitivity available from 12-micron square pixels combine with a low noise architecture to allow system designers to improve overall image quality, or to relax system tolerances to achieve lower cost. The excellent uniformity of the KAF-09000 image sensor improves overall image integrity by simplifying image corrections, while integrated anti-blooming protection prevents image bleed from over-exposure in bright areas of the image. To simplify device integration, the KAF-09000 image sensor uses the same pin-out and package as the KAF-16801 image sensor. The sensor utilizes a Transparent Gate Electrode to improve sensitivity compared to the use of a standard front side illuminated polysilicon electrode.
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Product Details "KAF-09000-ABA-DP-BA"
Manufacturer: | ON Semiconductor |
Type: | Area Sensors |
Sensor type: | CCD |
Shutter type: | Global shutter |
Pins / Balls: | 34 |
Pixel size x [µm]: | 12 |
Aspect Ratio: | 1 : 1 |
Pixel size y [µm]: | 12 |
Protective Film: | yes |
Chromatics: | monochrome |
Resolution [MP]: | 9.52 |
Sensor size [inch/mm]: | 645 1.3x |
Frame rate [fps]: | 0.4 |
Further specification: | Broad Dynamic Range | CERDIP Package (sidebrazed pins, CuW) |
Horizontal Resolution: | 3085 |
Vertical Resolution: | 3085 |
Package: | DIP (Ceramic) |
Packaging Container: | Taped Clear Cover Glass (no coatings) |
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